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Projection Pattern

Test patterns (Fischer sample) for scanning probe microscopy. The projection patterns can be used for resolution control (in a range from 220 nm to 990 nm) and lateral calibration.

Monolayers of hexagonal closely packed latex spheres, deposited on suitable substrates, are used as a mask for physical vapour deposition.

Projection Pattern

Fig 1: Fischer samples at different production stages:

  1. Monolayer (left side) and bilayer (right side) of 439 nm spheres adsorbed on glass
  2. Metal coating and separation of the monolayer areas
  3. Displacement of the latex spheres AFM high contrast 15 nm
  4. Phase contrast image made in the AFM tapping mode

Typical applications:

Specifications:

Projection Pattern in available stock

Delivery: Approx. 2 weeks ARO.

AL 220
Availability in stock: 10
AL 230
Availability in stock: 22
AL 356
Availability in stock: 14
AL 453
Availability in stock: 20
AL 505
Availability in stock: 10
AL 990
Availability in stock: 22
AL 1238
Availability in stock: 10
AU 356
Availability in stock: 7
AU 453
Availability in stock: 11
AU 505
Availability in stock: 41
AU 990
Availability in stock: 32
Chrom 230
Availability in stock: 3
Chrom 453
Availability in stock: 4